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STAr's Virgo series of high performance parametric probe cards enable low-level leakage current and capacitance testing with consistent results and high accuracies under extreme thermal conditions on small pads used in nanometer technologies.
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STAr's wafer sort tests cantilever probe cards represents the finest epoxy technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, etc.
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STAr's excellent semiconductor reliability engineering system comprises of design for reliability, wafer-level and package-level reliability, device/process qualification and continuous reliability monitoring.
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STAr provides parameteric test software for automatic tests and application specific measurements to enhance customers' efficiencies and cost-of-ownership of these instruments.
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STAr supplier cost effective semiconductor ATE test systems for linear, power management and mixed signal markets. STAr also provides excellent sales and application service and support to ensure our customers attain the highest level of return-on-investments and satisfaction.