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The SIGMATM featuring GEMINI® technology, provides outstanding imaging and analytical results from a field emission scanning electron microscope with the capability to handle all material types. GEMINI® is established as the market leading field emission column design offering unrivaled ease of use, superb low voltage imaging and ultra stable
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AURIGA®Information Beyond Resolution
CrossBeam® workstations . the ultimate combination of FIB and GEMINI® column
The AURIGA® is a highly flexible CrossBeam® workstation for custom tailored applications.
Unique Imaging
Imaging of non-conductive specimens using all standard detectors with local charge compensation
Simultaneous
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ULTRA SeriesUltra High Resolution FE-SEM for Nano-scale Compositional Analysis
ULTRA PLUSNanoanalytical tool for high resolutionimaging and material analysis
The ULTRA FE-SEM is the ultimate lab tool to meet the most demanding requirements from material science, life science and semiconductor applications. The ULTRA FE-SEM integrates the
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EVO® HDHigh Performance, Total Flexibility
The EVO® HD is the latest innovation in scanning electron microscopy from Carl Zeiss. Delivering a groundbreaking increase in resolution over conventional scanning electron microscopes (SEM), the EVO® HD introduces High Definition to electronmicroscopy.
The EVO® HD features a new electron source
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The SIGMATM featuring GEMINI® technology, provides outstanding imaging and analytical results from a field emission scanning electron microscope with the capability to handle all material types. GEMINI® is established as the market leading field emission column design offering unrivaled ease of use, superb low voltage imaging and ultra stable
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AURIGA®Information Beyond Resolution
CrossBeam® workstations . the ultimate combination of FIB and GEMINI® column
The AURIGA® is a highly flexible CrossBeam® workstation for custom tailored applications.
Unique Imaging
Imaging of non-conductive specimens using all standard detectors with local charge compensation
Simultaneous
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ULTRA SeriesUltra High Resolution FE-SEM for Nano-scale Compositional Analysis
ULTRA PLUSNanoanalytical tool for high resolutionimaging and material analysis
The ULTRA FE-SEM is the ultimate lab tool to meet the most demanding requirements from material science, life science and semiconductor applications. The ULTRA FE-SEM integrates the
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MC-1180 digital biological microscopes are equipped with achromatic objectives and wide field eyepieces and digital trinocular. It provide clear image, wide field, convenience operation. It can observe and display dynamic micro image at the same time. It can be used for biology, medicine, agriculture and industry area widely. It is the ideal
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EVO® HDHigh Performance, Total Flexibility
The EVO® HD is the latest innovation in scanning electron microscopy from Carl Zeiss. Delivering a groundbreaking increase in resolution over conventional scanning electron microscopes (SEM), the EVO® HD introduces High Definition to electronmicroscopy.
The EVO® HD features a new electron source
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LSM 780 - Get More Results.
The more demanding the applications, the greater your need for improved detection performance. With the GaAsP spectral detector of LSM 780 we have taken the proven sensitivity of the LSM 710 an important step forward.
New Functions
UV laser 355nm CW with solid state technology, for excitation, manipulation and
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LSM 700 - Flexible Confocal Microscope (CLSM)
The Carl Zeiss LSM 700 Laser Scanning Microscope sets a new standard in confocal microscopy. Based on tried-and-approved technology concepts, the system offers innovative solutions for image analyses of extraordinary sensitivity and quality, and that at a very attractive price/performance
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The JSM-6510 is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6510 enables observation of specimens up to 150mm in diameter.
Throughout the evolution of