The equipment automatically and periodically measure property values constant temperature chamber without manual process by implementing constant temperature chamber and measuring instrument for evaluating reliability of high output LED unit and module.   Reliability test   ㆍDurability test: Measure properties of

Measure all performance items necessary for KS and certification. High performance and low cost equipment (Patent registration in progress)   floor plan Measuring

Measurement for base data of optical and electrical conversion efficacy to figure out which electrical signal detector such as solar cell outputs for radiance exitance or illumination by each wavelength.   Key features   ㆍMeasuring targets : Solar cell, silicon and optical diode ㆍChannel : 4ch auto

I-V CURVE meter dedicated to solar cell. Current measurement for various types of solar cell : Measure polarizations for 20A Measure Series resistance Rs, and parallel resistance Rsh Key features    ​          ㆍI-V CURVE meter dedicated to solar

Detect find crack of solar cell module-EL tester. Test efficacy among Cells/Strings of solar modules, Patented light source- Transferred technique from KRISS Measuring items   ㆍDetect find crack of solar cell module - EL tester - Imagery interpretation by infrared ray : 1sec / cell - Detect fine crack:

Calculate the highest percent flicker and flicker index by measuring average optical power of lamp   Technical Specifications * Photo diode : silicone photodiode, effective section area :100mm2, Mismatching factor : f1’<1.5% Class L * Equipment Sampling Rate : 5 kHz * Calculate Flicker Index and

Equipment to measure electrical and optical properties of LED epi wafer at the same time.   Measure EL property of LED epi   ㆍMeasure electroluminescence of LED epi wafer. ㆍ Measure upper/lower illumination of wafer by using glass. ㆍHas measuring sensors in upper and lower

It is program that automatically counts the number of chips with features; video processing speed : 10 sec/ 2inch wafer, input of model name, serial number, operator name, set up, save, open and modify condition for various chips.   Measurement via scanning   ㆍOptical resolution: 4,800dpi×9,600dpi (with

Easy to measure various items, User interface (Support on-demand SW design), integrated measurement of optical, electric

Measurement and data usability with consideration of user convenience in quality inspection, R&D, and reliability test.   Simultaneous measurement of optical properties/Electrical property   ㆍSimultaneous measurement of optical properties/Electrical property by one click. ㆍHigh sensitivity and

Measure optical/electrical/thermal properties for various high output, multi-chip, and module LED/OLED as well as current stressing and measurement. Support up to 3A and consecutive/pulse type   Measure performance of high output, multi chip LED/OLED   ㆍMeasure optical/electrical/thermal properties for various

Connect various mass-production equipment (Sorter.Prover.Handler) to tester. Provide user friendly interface and Under Photometer function. Automatically save collected data as Excel file and statistical processing.   Specificatons Peak / Dominant Wavelength p, d Refer to LEOS(OPI-100)

Measure thermal property of LED according to change of temperature in normal or excessive conditions and analyze change of optical and electrical property in accordance with change of temperature in normal.   Key features   ㆍMeasure temperature in PN connection part and thermal resistance by analyzing physical

Easy and simple measurement of angle of beam spread and luminous intensity of various LEDs by one click. Highly scalable and compatible with other equipment and measuring items. Easy to edit and use measurement results (Display characteristics of light   Easy to measure angle of beam spread and luminous intensity of various

Portable and cost effective measurement device that can rapidly measure optical power and Vf. With attached barrel and integrating sphere, it measuresluminous intensity and speed of total luminous transmittance.   Simple and easy measurement   ㆍSimple measurement of LED's optical power and Vf in Q/C, R/D,

Simultaneously measure optical and electrical property of high output LED to the change of temperature.Measure performance of high output single and multi chip LED.Measure optical and eelectrical properties at the same time, rapidly control temperature an   Measure performance of high output single and multi chip

Simultaneously measure optical and electrical property of high output LED to the change of temperature. Measure performance of high output single and multi chip LED.Measure optical and eelectrical properties at the same time, rapidly control temperature a   Measure performance of LED eip chip wafer   ㆍUniversal

Thermal LEOS is able to measure MULTI CHANNEL LEOS optical and electrical property of MULTI CHANNEL LEOS as well as thermal property. It allows measurement of temperature and thermal resistance of PN connection part by analyzing physical property of high   Key features   ㆍMeasurement of temperature and

Optimized equipment to test LED for testing performance and measurement in compliance with ISO standard.   Provide integrated measurement for optical and electrical properties   ㆍMeasure optical and electrical properties in compliance with LED measurement standard. ㆍhigh sensitivity and resolution

While it has the same features as OPI-310(Goniophtometer), it is highly scalable to various measurement targets such as BLU, LCD, general lighting devices, etc   Additional features / functions   ㆍMeasure a variety of light sources including LED, LED module, BLU, LCD, general lightdevices,etc ㆍMeasuring